| 2025 |
IEEE Access |
Analysis of bias temperature instability in peripheral CMOS devices for low-temperature memory applications
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2025-09-03 |
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| 2025 |
IEEE Electron Device Letters |
Impact of Al-doping on ferroelectricity and reliability of HfZrO film under high temperature annealing
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2025-09-04 |
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| 2025 |
IEEE Transactions on Nanotechnology |
Demonstration of ferroelectric tunnel field-effect transistor for low power synapse device
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2025-08-19 |
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| 2025 |
IEEE Access |
Suppression of reverse drain-induced barrier lowering in negative capacitance FETs using a hetero-metal-gate structure
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2025-06-04 |
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| 2025 |
Solid-State Electronics |
Rigorous analysis on the operating mechanism of gate-injection ferroelectric flash
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2025-10-01 |
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| 2025 |
Electronics |
Optimization of cross-bridge Kelvin resistor (CBKR) layout for the precise contact resistance measurement of TiSi2/n+ Si
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2025-02-15 |
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| 2025 |
IET (The Institution of Engineering and Technology) Electronics Letters |
A 7-Bit 700 MS/s 2b/Cycle Asynchronous SAR ADC WithPartially Merged Capacitor Switching
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2025-08-23 |
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| 2025 |
Journal of Semiconductor Technology and Science |
A BJT-based CMOS Temperature Sensor With a ±0.94℃ 3σ-inaccuracy From -40℃ to +150℃
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2025-06-01 |
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| 2025 |
Journal of Semiconductor Technology and Science |
A 232.2nW Segmented Curvature Sub-BGR with Bandgap Core Reusing
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2025-06-01 |
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| 2025 |
IEEE Journal of Solid-State Circuits |
A Hybrid Voltage-Time Domain Pipelined ADC With Reference-Embedded Time-Domain Residues
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2025-06-01 |
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